Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB

Novel FIB Torus Milling on Diamond Anvils with FIB Gasket Fabrication Enabling 5+ Megabar High Pressures Studies

“Stand-Out”: A Novel Approach for Preparing Sub-100 nm Samples Through in situ Ion Induced Bending

Detailed Investigation of Silicon Nitride Phase Plates Prepared by Focused Ion Beam Milling

Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations

Xe Plasma vs Gallium FIB Delayering

Light Ion Beams Interacting with Thin Films

Helium Ion Microscopy Imaging of Bottlebrush Copolymers

A Method for FIB Liftout of Particles in Epoxy Resin

3D-Printed Lift Outs For EXLO and INLO Practice and Training

FIB Sample Preparation for In Depth EDS Analysis

In Situ Analysis of Cryoformed Metals by STEM

A Fast and Accurate Workflow for Analytic 3D FIB-SEM Tomography

Microstructural and Defect Characterization of Al-Si Alloy Using PFIB and EMPAD

Demonstration of High Efficiency Diffractive Optics for Electrons Fabricated with Ion Beam Gas-Assisted Etching

Channeling Contrast Simulation of Secondary Electron Images in Scanning Ion Microscopes

Using Plasma Focused Ion Beam Microscopy to Characterize 3D Structure and Porosity of OPC Mortar

Current and Emerging Microscopy for Quantum Information Sciences

Emerging Microscopy for Quantum Information Sciences

Atomic Resolution CryoSTEM Across Continuously Variable Temperatures

New Advanced Electron Microscopy to Discover New Quantum Materials

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Current and Emerging Microscopy for Quantum Information Sciences