Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T10:30:34.769Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations

Published online by Cambridge University Press:  05 August 2019

Shigeyasu Tanaka  and
Yusuke Ohmi
Shigeyasu Tanaka
Affiliation:
College of Life and Health Science, Chubu University, Kasugai-shi, Aichi, Japan.
Yusuke Ohmi
Affiliation:
College of Life and Health Science, Chubu University, Kasugai-shi, Aichi, Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 902 - 903
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Knot, G and Genoud, C, J. Cell Science 126 (2013), p. 4545.Google Scholar
[2]Hing, HL et al. , Microsc Microanal 13 (Suppl 2) (2007) p. 1528.Google Scholar
[3]This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.Google Scholar