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Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations

Published online by Cambridge University Press:  05 August 2019

Shigeyasu Tanaka
Affiliation:
College of Life and Health Science, Chubu University, Kasugai-shi, Aichi, Japan.
Yusuke Ohmi
Affiliation:
College of Life and Health Science, Chubu University, Kasugai-shi, Aichi, Japan.

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Knot, G and Genoud, C, J. Cell Science 126 (2013), p. 4545.Google Scholar
[2]Hing, HL et al. , Microsc Microanal 13 (Suppl 2) (2007) p. 1528.Google Scholar
[3]This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.Google Scholar