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3D-Printed Lift Outs For EXLO and INLO Practice and Training
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation and Techniques
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Giannuzzi, LA et al. , in Introduction to Focused Ion Beams (Springer, New York), p. 201-228.Google Scholar
[2]Kamino, T et al. , in Introduction to Focused Ion Beams (Springer, New York), p. 229-246.Google Scholar
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