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Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB

Published online by Cambridge University Press:  05 August 2019

Suzy Vitale ,
Andrew Steele ,
Liane G. Benning  and
Richard Wirth
Suzy Vitale*
Affiliation:
Carnegie Institution for Science, Geophysical Laboratory, Washington, DC, USA.
Andrew Steele
Affiliation:
Carnegie Institution for Science, Geophysical Laboratory, Washington, DC, USA.
Liane G. Benning
Affiliation:
German Research Center for Geosciences, GFZ, PotsdamGermany.
Richard Wirth
Affiliation:
German Research Center for Geosciences, GFZ, PotsdamGermany.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 894 - 895
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Young, R and Moore, M in “Introduction to Focused Ion Beams”, (Springer, New York) p. 249-268.Google Scholar
[2]Giannuzzi, LA et al. in “Introduction to Focused Ion Beams”, (Springer, New York) p. 201-228.Google Scholar
[3]Steele, A et al. , Science Advances 4 (2018).Google Scholar
[4]Steele, A et al. , Science 337 (2012), pp. 212-215.Google Scholar
[5]Kamino, T et al. in “Introduction to Focused Ion Beams”, (Springer, New York) p. 229-246.Google Scholar