Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving

Study of Groove Formation in InP Surface During Zn Diffusion

Zeolite Crystal Growth Analysis by Dissolution

Gold-Assisted Growth of Pyramid-shape SrTiO3 Bases During Thermal Dewetting

Sequential Collective Microanalysis (SCM) Applied on the Characterization of Atmospheric Carbonaceous Particulate Materials Collected in the Metropolitan Area of Monterrey, in México

Analysis of Denton E-Beam 2 Nanofabricated Thin Films by Metrology

Analyses of the Morphological Stability of γ' Particles in Turbine Blades Removed from Service Manufactured from a Ni-based Superalloy

Time-Resolved in situ Raman Spectroscopic Observations of a Biomineralization Model System

Characterization of Localized Elemental Composition of Core-Shell Pd/C Catalysts by FESEM/EDS and STEM/EDS

Microstructural Evolution of the Boiler Tubes After Long-Term Service

Microanalysis of Antigorite in Brake Pads

New Insights into Gold Mineralization at the Yellowknife City Gold Project, Northwest Territories from Synchrotron micro-XRF and PXRD

A Comparative Evaluation of the Intensities, Spectral Resolution, and Overall Time of Acquisition Achievable by SEM-based Parallel Beam WDS and SEM-based Rowland Circle WDS

In-situ Nanoscale Characterization of Polymer Melting and Crystallization via Multimodal Chemical Imaging

SEM Study of Growth of SnO2 Nanoflowers in Thin films by Spray Pyrolysis

Probing Threading Dislocations in a Micrometer-Thick GaN Film by High-Voltage Scanning Transmission Electron Microscopy

Mechanical Synthesis of Fullerene-Graphene/Morphed Graphene Architectures

Correcting an Aberration with a Wire Corrector for SEM

In situ Measurement of Diamond/SiC Interfacial Strength

Advances in Focused Ion Beam Instrumentation and Techniques

Avoiding FIB damage using the “umbrella” method

Ion Induced Bidirectional Bending for Controlled Manipulation at Nanoscale

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving

Advances in Focused Ion Beam Instrumentation and Techniques