Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques

Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

Too Close for Comfort: Creating Two TEM Samples From Areas Separated By 270 Nanometers

Two Methods for Measuring Lamellae Thicknesses In situ for Improved FIB Specimen Preparation

Focused Ion Beams of Xe+, Ar+, O+, and N+: Sputter Rate Trends, Chemical Interactions, and Emerging Applications

Exploring Heterogeneity in Li Battery Electrodes using FIB-SEM Integrated with Raman and TOF-SIMS

Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature's Tiniest Structures

Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries

Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Advances in Multi-Beam and Multi-Ion FIB-SEM for 3D Correlative Microscopy

Tri-beam FIB Sample Preparation to Study Alterations in Ancient Glass from Broborg, a Vitrified Swedish Hillfort

Combining a Nanoprobing Setup with PFIB Sample Deprocessing

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Advanced FIB-based Preparation of Cryogenically-prepared Specimens for APT Analysis

Residual Stress in Focused Charged Particle Beam-Deposited Materials

Plasma FIB Spin Milling for 3D Residual Stress Measurements

Passive Voltage Contrast Applications with Helium Ion Microscopy Imaging

Ar+ FIB Milling and Measurement of FIB Damage in Silicon

Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry

Analytics on the FIB: ORION-SIMS and the Discovery of a Unique Chondrite-like, Precambrian Impactor

Understanding Microstructural Evolution in ZrC Inoculated Zr47.5Cu45.5Al5Co2 Via High Resolution SIMS

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Advances in Focused Ion Beam Instrumentation and Techniques