Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-05T09:38:25.699Z Has data issue: false hasContentIssue false
  • English
  • Français

Using Plasma Focused Ion Beam Microscopy to Characterize 3D Structure and Porosity of OPC Mortar

Published online by Cambridge University Press:  05 August 2019

Peng Dong ,
Ali Allahverdi ,
Hui Yuan  and
Nabil D. Bassim
Peng Dong
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
Ali Allahverdi
Affiliation:
School of Chemical Engineering, Iran University of Science and Technology, Tehran, Iran.
Hui Yuan
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
Nabil D. Bassim*
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 926 - 927
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Holzer, L in “Review of FIB-tomography”, ed. Utke, I, (Oxford University Press, New York) p. 410.Google Scholar
[2]Bassim, N, Scott, K, and Giannuzzi, LA, MRS Bulletin 39 (2014), p. 317.Google Scholar
[3]Burnett, TL et al. , Ultramicroscopy 161 (2016), p. 119.Google Scholar
[4]Schankula, CC, Anand, , and Bassim, N, Computing and Software Report (2018).Google Scholar