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Exploring Heterogeneity in Li Battery Electrodes using FIB-SEM Integrated with Raman and TOF-SIMS

Published online by Cambridge University Press:  05 August 2019

Dean J. Miller ,
Dave Zapotok ,
Jon Hiller ,
Zdenek Juracka ,
Ute Schmidt ,
Tavis Ezell ,
Nancy Senabulya ,
Bobby Kerns ,
Marco-Tulio Fonseca Rodrigues  and
Victor A. Maroni
...Show all authors
Dean J. Miller
Affiliation:
TESCAN USA, Warrendale, PA, USA.
Dave Zapotok
Affiliation:
TESCAN USA, Warrendale, PA, USA.
Jon Hiller
Affiliation:
TESCAN USA, Warrendale, PA, USA.
Zdenek Juracka
Affiliation:
TESCAN USA, Warrendale, PA, USA.
Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Germany.
Tavis Ezell
Affiliation:
WITec GmbH, Ulm, Germany.
Nancy Senabulya
Affiliation:
Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI, USA.
Bobby Kerns
Affiliation:
Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI, USA.
Marco-Tulio Fonseca Rodrigues
Affiliation:
Chemical Sciences & Engineering Division, Argonne National Laboratory, Argonne, IL, USA.
Victor A. Maroni
Affiliation:
Chemical Sciences & Engineering Division, Argonne National Laboratory, Argonne, IL, USA.
Daniel P. Abraham
Affiliation:
Chemical Sciences & Engineering Division, Argonne National Laboratory, Argonne, IL, USA.

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 862 - 863
Copyright
Copyright © Microscopy Society of America 2019 

References

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