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Passive Voltage Contrast Applications with Helium Ion Microscopy Imaging
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation and Techniques
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Tan, S & Livengood, R in “Helium Ion Microscopy”, ed. Hlawacek, G and Golzhauser, A, (Springer, Switzerland), 2016, p. 471.Google Scholar
[4]Xia, D, McVey, S, Huynh, C and Kuehn, W, ACS Appl. Mater. Interfaces, 11 (2019), p.5509.Google Scholar
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