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Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

Published online by Cambridge University Press:  05 August 2019

Kenta K. Ohtaki ,
John P. Bradley  and
Hope A. Ishii
Kenta K. Ohtaki
Affiliation:
University of Hawaii HIGP, Honolulu, USA
John P. Bradley
Affiliation:
University of Hawaii HIGP, Honolulu, USA
Hope A. Ishii*
Affiliation:
University of Hawaii HIGP, Honolulu, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 854 - 855
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]McCaffrey, JP et al. , Ultramicroscopy 87 (2001), p. 97.Google Scholar
[2]Mayer, J et al. , MRS Bulletin 32 (2007), p. 400.Google Scholar
[3]Melo, LG et al. , J Power Sources 312 (2016), p. 23.Google Scholar
[4]Xu, Y et al. , Earth Planets Space 70 (2018), p. 150.Google Scholar