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Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature's Tiniest Structures

Published online by Cambridge University Press:  05 August 2019

Annalena Wolff ,
Nico Klingner ,
William Thompson ,
Yinghong Zhou ,
Jinying Lin ,
Yong Y Peng ,
John A.M. Ramshaw  and
Yin Xiao
Annalena Wolff*
Affiliation:
Central Analytical Research Facility, Institute for Future Environments, Queensland University of Technology (QUT), Brisbane, Australia.
Nico Klingner
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Dresden, Germany.
William Thompson
Affiliation:
HeelionicsLLC, Los Altos, CA, USA.
Yinghong Zhou
Affiliation:
Institute of Health and Biomedical Innovation, Queensland University of Technology (QUT), Brisbane, Australia. The Australia-China Centre for Tissue Engineering and Regenerative Medicine (ACCTERM), Queensland University of Technology, Brisbane, Australia.
Jinying Lin
Affiliation:
Department of Implantology, Xiamen Stomatological Research Institute, Xiamen Stomatological Hospital, Fujan, China. The Australia-China Centre for Tissue Engineering and Regenerative Medicine (ACCTERM), Queensland University of Technology, Brisbane, Australia.
Yong Y Peng
Affiliation:
CSIRO Manufacturing, Bayview Avenue, Clayton, Australia.
John A.M. Ramshaw
Affiliation:
CSIRO Manufacturing, Bayview Avenue, Clayton, Australia. Department of Surgery, St. Vincent's Hospital
Yin Xiao
Affiliation:
Institute of Health and Biomedical Innovation, Queensland University of Technology (QUT), Brisbane, Australia. The Australia-China Centre for Tissue Engineering and Regenerative Medicine (ACCTERM), Queensland University of Technology, Brisbane, Australia.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 864 - 865
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Drobne, et al. , Microscopy Research and Technique 70 (2007), p. 895.Google Scholar
[2]Stokes, et al. , Journal of Physics: Conference Series 26 (2006), p. 50.Google Scholar
[3]Bandara, et al. , ACS Applied Materials & Interfaces 9 (2017), p. 6746.Google Scholar
[4]Ziegler, et al. , www.srim.org.Google Scholar
[5]The authors acknowledge scientific and technical assistance of Peter Hines, Jamie Riches, Rachel Hancock, and Ning Liu and the facilities at the Australian Microscopy & Microanalysis Research Facility (AMMRF) at the Central Analytical Research Facility (CARF), Queensland University of Technology, Brisbane, Australia.Google Scholar