Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-27T10:30:25.231Z Has data issue: false hasContentIssue false

Plasma FIB Spin Milling for 3D Residual Stress Measurements

Published online by Cambridge University Press:  05 August 2019

B. Winiarski*
Affiliation:
Thermo Fisher Scientific, V.Pecha 12, Brno 627 00, Czech Republic The Henry Royce Institute, School of Materials, The University of Manchester, M13 9PL, U.K.
C. Rue
Affiliation:
Thermo Fisher Scientific, 5350 NE Dawson Creek Dr, Hillsboro, OR 97124, USA
P.J. Withers
Affiliation:
The Henry Royce Institute, School of Materials, The University of Manchester, M13 9PL, U.K.
*
*Corresponding author: [email protected]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Winiarski, B and Withers, PJ., Experimental Mechanics 52/4 (2012), p. 417428.Google Scholar
[2]Winiarski, B et al. , Metallurgical and Materials Transactions A41/7 (2010), p. 1743-1751.Google Scholar
[3]Massl, S et al. , Scripta Materialia 59/5 (2008), p. 503506.Google Scholar
[4]Korsunsky, AM et al. , Surface Coating Technology 205 (2010), p. 2393–2403.Google Scholar
[5]Schajer, GS, Winiarski, B and Withers, PJ. Experimental Mechanics 53 (2013), p. 255-265.Google Scholar
[6]Burnett, TL, Kelley, R, Winiarski, B et al. , Ultramicroscopy 161 (2016), p. 119-129.Google Scholar
[7]Winiarski, B et al. , 3D MS Conference (2016), p. 34.Google Scholar
[8]Winiarski, B et al. , Ultramicroscopy 172 (2017), p. 52-64.Google Scholar
[9]Cao, Y et al. , Scientific Reports 5 (2015), p. 10789.Google Scholar