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Residual Stress in Focused Charged Particle Beam-Deposited Materials

Published online by Cambridge University Press:  05 August 2019

Gavin Mitchson ,
Andrew Clarke  and
Jamie Johnson
Gavin Mitchson*
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis Division, Hillsboro, ORUSA.
Andrew Clarke
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis Division, Hillsboro, ORUSA.
Jamie Johnson
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis Division, Hillsboro, ORUSA.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 880 - 881
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]The authors thank Chad Rue and Tom Miller for their insights and conversations during this work.Google Scholar