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Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Published online by Cambridge University Press:  05 August 2019

Chengge Jiao ,
Lex Pillatsch ,
Johannes Mulders  and
David Wall
Chengge Jiao*
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
Lex Pillatsch
Affiliation:
Empa (Swiss Federal Laboratories for Materials Science and Technology), Laboratory for Mechanics of Materials and Nanostructures, Thun, Switzerland. TOFWERK AG, Thun, Switzerland.
Johannes Mulders
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
David Wall
Affiliation:
ThermoFisher Scientific, Eindhoven, the Netherlands.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 876 - 877
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ye, J et al. , Scientific Reports [Online] 5, 16190, (2015), https://www.nature.com.Google Scholar
[2]Hovington, P et al. , Scanning 38, (2016), p.571–578.Google Scholar
[3]Pillatsch, L, Ostlund, F, Michler, J, Progress in Crystal Growth and Characterization of Materials [Online] December 2018, https://doi.org/10.1016/j.pcrysgrow.2018.10.001.Google Scholar