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Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry

Published online by Cambridge University Press:  05 August 2019

Jean-Nicolas Audinot ,
Jelena Lovric  and
Tom Wirtz
Jean-Nicolas Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Jelena Lovric
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Tom Wirtz*
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 888 - 889
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wirtz, T, Philipp, P, Audinot, J-N, Dowsett, D, Eswara, S, Nanotechnology 26 (2015), p. 434001.Google Scholar
[2]Wirtz, T, Dowsett, D and Philipp, P in “Helium Ion Microscopy”, ed. Hlawacek, G and Gölzhäuser, A (Springer, Switzerland), p. 297.Google Scholar
[3]Dowsett, D, Wirtz, T, Anal. Chem. 89 (2017), p. 8957.Google Scholar
[4]Wirtz, T, De Castro, O, Audinot, J-N, and Philipp, P, Annual Review of Analytical Chemistry 12 (2019).Google Scholar
[5]Gratia, P et al. , J. Am. Chem. Soc. 138 (2016), p. 15821.Google Scholar
[6]Gratia, P et al. , ACS Energy Lett. 2 (2017), p. 2686.Google Scholar
[7]Vollnhals, F et al. , Anal. Chem. 89 (2017), p. 10702.Google Scholar
[8]This work was co-funded by the National Research Fund Luxembourg (FNR) within the framework of the SOLAR4D project through grant INTER/SNF/16/11534230.Google Scholar