Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy

Theory and Practice of Diffractometry on Single Tungsten Atoms using Electron Microscope Pixel Array Detectors

Imaging of Individual Vacancies Using Electron Channeling Contrast in STEM

Electron Microscopy with Structured Electrons

Three-dimensional Confocal Imaging Using Coherent Elastically Scattered Electrons

Sub-Nanometer-Resolution Magnetic Field Observation Using Aberration-Corrected 1.2-MV Holography Electron Microscope with Pulse Magnetization System

Aberration Corrected Lorentz Microscopy to Investigate Magnetic Domain Walls in Co-Pt Nano-Chessboards

New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging

Low-Voltage TEM/STEM for Imaging and Spectroscopy of Low-Dimensional Materials

A new detection scheme for van der Waals heterostructures, imaging individual fullerenes between graphene sheets, and controlling the vacuum in scanning transmission electron microscopy

Etching and Mending of Graphene Edges by Cu and Pt Atoms

Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.

Development of Compact Cs/Cc Corrector with Annular and Circular Electrodes

Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment

Phase Retrieval Quantitative Comparison Between Tilt-series Imaging in TEM and Position-resolved Coherent Diffractive Imaging in STEM

A Novel Method for Higher Order Aberration Correction in Electron Microscopes

Analysis of Phase Difference Variations for Strong Dynamical Objects Using Wigner Distribution Deconvolution Ptychography

A Comparison of Phase-retrieval Algorithms for Focused-probe Electron Ptychography

Depth-Dependent Contrast in Probability-Current Imaging from Channeling in Crystalline Materials

Better Contrast for Imaging Defects by ABF

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract