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Sub-Nanometer-Resolution Magnetic Field Observation Using Aberration-Corrected 1.2-MV Holography Electron Microscope with Pulse Magnetization System

Published online by Cambridge University Press:  04 August 2017

Toshiaki Tanigaki ,
Tetsuya Akashi ,
Akira Sugawara ,
Katsuya Miura ,
Jun Hayakawa ,
Kodai Niitsu ,
Takeshi Sato ,
Xiuzhen Yu ,
Yasuhide Tomioka  and
Ken Harada
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Toshiaki Tanigaki
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan
Akira Sugawara
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan
Katsuya Miura
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan
Jun Hayakawa
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan
Kodai Niitsu
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan
Takeshi Sato
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka, Japan
Xiuzhen Yu
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan
Yasuhide Tomioka
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Ken Harada
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan
Daisuke Shindo
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yoshinori Tokura
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan Department of Applied Physics and Quantum-Phase Electron Center (QPEC), University of Tokyo, Tokyo, Japan
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 452 - 453
Copyright
© Microscopy Society of America 2017 

References

[1] Dunin-Borkowski, RE, et al, Microsc. Microanal 18(Suppl. 2 2012). p. 1708.Google Scholar
[2] Snoeck, E, et al, Microsc. Microanal 20(Suppl. 3 2014). p. 932.Google Scholar
[3] Tanigaki, T, et al, Adv. Imaging Electron Phys 198 2016). p. 69.Google Scholar
[4] Gatel, C, et al, Nano Lett 15 2015). p. 6952.Google Scholar
[5] Tanigaki, T, et al, Microsc. Microanal 22(Suppl. 3 2016). p. 1702.3.Google Scholar
[6] Part of this research was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the "Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)" initiated by the Council for Science, Technology, and Innovation (CSTI).Google Scholar