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Depth-Dependent Contrast in Probability-Current Imaging from Channeling in Crystalline Materials

Published online by Cambridge University Press:  04 August 2017

Zhen Chen ,
Kayla X. Nguyen ,
Celesta S. Chang ,
Michael C. Cao  and
David A. Muller
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Kayla X. Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Celesta S. Chang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Michael C. Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca NY 14853, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 478 - 479
Copyright
© Microscopy Society of America 2017 

References

References:

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[9] Research supported by PARADIM, an NSF MIP (DMR-1539918), with electron microscope facilities support from CCMR, an NSF MRSEC (DMR-1120296).Google Scholar