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Etching and Mending of Graphene Edges by Cu and Pt Atoms

Published online by Cambridge University Press:  04 August 2017

Emi Kano ,
Ayako Hashimoto  and
Masaki Takeguchi
Emi Kano
Affiliation:
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan In-situ Characterization Technique Development Group, National Institute for Materials Science, Tsukuba, Japan
Ayako Hashimoto
Affiliation:
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan In-situ Characterization Technique Development Group, National Institute for Materials Science, Tsukuba, Japan Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, Tsukuba, Japan Transmission Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Japan
Masaki Takeguchi
Affiliation:
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan In-situ Characterization Technique Development Group, National Institute for Materials Science, Tsukuba, Japan Transmission Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 462 - 463
Copyright
© Microscopy Society of America 2017 

References

[1] Datta, S. S., et al., Nano Lett. 8 2008 1912–1915.Google Scholar
[2] Ramasse, Q. M., et al., ACS Nano 6 2012 4063–4071.Google Scholar
[3] Wang, H., et al., Nanoscale 4 2012 2920–2925.Google Scholar
[4] Zhao, J., et al., Proc. Natl. Acad. Sci. 111 2014 15641–15646.Google Scholar
[5] Kano, E., et al., Nanoscale 8 2016 529–535.Google Scholar
[6] A part of this work was supported by “Nanotechnology Platform Project” of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan, and JSPS KAKENHI Grant Numbers 15J04118, 25390035 and 16H03875, Japan.Google Scholar
[7] First author will move after the graduation: National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada.Google Scholar