Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Z-contrast imaging for elemental analysis: Single atoms to clusters

Facet Selective Growth of Iridium Chains/Wires of Single-Atom Width on the {1010} Surfaces of ZnO Nanowires

Z-contrast Imaging of Incommensurately Modulated Structure in Plagioclase Feldspars

Atomic Resolution Microscopy of Clathrate-I Type Borosilicides

Standards, Reference Materials, and Their Applications in Quantitative Microanalysis

Abstract

Current Status of ISO/TC202 - Microbeam Analysis

USGS Microanalytical Reference Materials (MRMs) Development

Natural and Synthetic Glass and Crystal Reference Materials for Trace Element Microanalysis

Use of Mineral Reference Standards in EPMA: Instrumental Calibration, Standards Comparison, and Quality Control

Status of the Smithsonian Microbeam Standards 2017 With a Discussion of the Venerable VG-2 Basalt Glass

Relative uncertainties in mass attenuation coefficients and their influence on quantitative EDS and WDS analysis

Minerals from the Kakanui Volcanic Breccia: A 2017 Look at Geological Reference Materials for EPMA

Application of SIMS-SSAMS to Characterization of Surrogate Pre- and Post-Detonation Urban Debris Standard Reference Materials.

£ Factor and k-Factor Determination Using Needle Samples

Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD)

Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging

Practical Utilization of Uranium-Containing Particulate Test Samples for SEM/EDS and SIMS Automated Particle Analysis Method Validation

Measuring Carbon in Steel Using Calibration Curves on the Microprobe; Failed Cap Screw Study

Inspection Tool for Testing an Electron Beam in an Electromagnetic Lens System

Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Standards, Reference Materials, and Their Applications in Quantitative Microanalysis

Abstract