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Better Contrast for Imaging Defects by ABF
Published online by Cambridge University Press: 04 August 2017
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 480 - 481
- Copyright
- © Microscopy Society of America 2017
References
[4] The authors gratefully acknowledge the financial support through a Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS), and “Nanotechnology Platform” (Project No. 12024046) from the Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT), the National Natural Science Foundation of China (51672007, 51502007), National Basic Research Program of China (2016YFA0300804, 2016YFA0300903), and “2011 Program” Peking-Tsinghua-IOP Collaborative Innovation Centre for Quantum Matter..Google Scholar
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