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Phase Retrieval Quantitative Comparison Between Tilt-series Imaging in TEM and Position-resolved Coherent Diffractive Imaging in STEM

Published online by Cambridge University Press:  04 August 2017

Emanuela Liberti ,
Gerardo Martinez ,
Colum O’Leary ,
Peter Nellist  and
Angus Kirkland
Emanuela Liberti
Affiliation:
Electron Physical Science Imaging Centre (ePSIC), Diamond Light Source, Harwell Campus & Innovation Centre, Didcot, Oxfordshire, UK. University of Oxford, Department of Materials, Oxford, UK.
Gerardo Martinez
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.
Colum O’Leary
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, Oxford, UK.
Angus Kirkland
Affiliation:
Electron Physical Science Imaging Centre (ePSIC), Diamond Light Source, Harwell Campus & Innovation Centre, Didcot, Oxfordshire, UK. University of Oxford, Department of Materials, Oxford, UK.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 470 - 471
Copyright
© Microscopy Society of America 2017 

References

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[6] Liberti, E., et al, Microscopy and Microanalysis 22 2016). p. 922.Google Scholar