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Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

H.G. Brown ,
N. Shibata ,
Z. Chen ,
M. Weyland ,
T.C. Petersen ,
D.M. Paganin ,
M.J. Morgan ,
H. Sasaki ,
L. J. Allen  and
S. D. Findlay
H.G. Brown
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia
N. Shibata
Affiliation:
Crystal Interface Laboratory, Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Z. Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, USA
M. Weyland
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia
T.C. Petersen
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia
D.M. Paganin
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia
M.J. Morgan
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia
H. Sasaki
Affiliation:
Furukawa Electric Ltd., Yokohama, Japan
L. J. Allen
Affiliation:
School of Physics, University of Melbourne, Melbourne, Australia
S. D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Melbourne, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 442 - 443
Copyright
© Microscopy Society of America 2017 

References

[1] Brown, H.G., et al, Phys. Rev. B 93 2016). p. 134116.CrossRefGoogle Scholar
[2] Close, R., et al, Ultramicroscopy 159 2015). p. 124.Google Scholar
[3] Chen, Z., et al, Ultramicroscopy 169 2016). p. 107.Google Scholar
[4] The authors acknowledge funding from the Australian Research Council’s Discovery Projects funding scheme (Projects No. DP140102538 and DP160102338).Google Scholar