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Aberration Corrected Lorentz Microscopy to Investigate Magnetic Domain Walls in Co-Pt Nano-Chessboards

Published online by Cambridge University Press:  04 August 2017

Isha Kashyap ,
Jerrold A. Floro ,
Yongmei M. Jin  and
Marc De Graef
Isha Kashyap
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, USA.
Jerrold A. Floro
Affiliation:
Dept. of Materials Science and Engineering, University of Virginia, Charlottesville, USA.
Yongmei M. Jin
Affiliation:
Dept. of Materials Science and Engineering, Michigan Technological University, Houghton, USA.
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 454 - 455
Copyright
© Microscopy Society of America 2017 

References

[1] De Graef, M. Introduction to conventional transmission electron microscopy 2003.Google Scholar
[2] Vetter, Eric P., Geng, Liwei, Ghatwai, Priya, et al, APL Materials 4 2016 096103.Google Scholar
[3] Mansuripur, M. Journal of Applied Physics 69(No. 4 1991). p. 2455.Google Scholar
[4] Vetter, Eric P., Ghatwai, Priya, Soffa, William A., et al, IEEE Magnetic Letters 6 2015 6600104.Google Scholar
[5] Kashyap, Isha & De, M. Graef acknowledge the support by grant MCF-677785, Materials Characterization Facility at Carnegie Mellon University. JAF acknowledges support of the National Science Foundation under grant DMR-1105336.Google Scholar