Instrumentation and Techniques
David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications
Abstract
XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
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New Detector Architecture, for Electron Microscopes with SDDs
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 204-205
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Characterization of an Annular Four-channel Silicon Drift Detector with a Light Element Window
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 206-207
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An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
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- 26 July 2009, pp. 208-209
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Aberration Correction in Energy Loss Spectrometers and Monochromators
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- 26 July 2009, pp. 210-211
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Automatic Correction of Spectral Aberrations in EELS
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 212-213
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Development of TEM-SXES instruments for valence electron spectroscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 214-215
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A New Wavelength Spectrometer for SEM Analysts
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 216-217
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Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic
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- 26 July 2009, pp. 218-219
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A New Detector for Backscattered Helium Ions in the 30 keV Energy Range
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- 26 July 2009, pp. 220-221
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Low-Energy Secondary Electron Filtering with Immersion Lens SEM
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 222-223
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Latest Developements in the New Wavelength Dispersive Solid-State Detector
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 224-225
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Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 226-227
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Performance of a Silicon-Drift Detector in 200kV TEM Environments
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 228-229
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Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector
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- 26 July 2009, pp. 230-231
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Real-Time Pulse Pile-up Recovery in X-ray Detector Data
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- 26 July 2009, pp. 232-233
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A Noise-Tolerant Method for Measuring MTF from Found-Object Edges in a TEM
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 234-235
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Image Quality Improvements in Thermionic Scanning Electron Microscopes
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 236-237
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Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 238-239
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A Novel Time-Resolved Fluorescence Microscope System Extended from the Deep UV-Visible to NIR (240nm - 1700nm)
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 240-241
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