Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

P Ercius; DA Muller

doi:10.1017/S1431927609098067

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Van Tendeloo, Gustaaf Bals, Sara Van Aert, Sandra Verbeeck, Jo and Van Dyck, Dirk 2012. Advanced Electron Microscopy for Advanced Materials. Advanced Materials, Vol. 24, Issue. 42, p. 5655.

Bals, Sara Goris, Bart Altantzis, Thomas Heidari, Hamed Van Aert, Sandra and Van Tendeloo, Gustaaf 2014. Seeing and measuring in 3D with electrons . Comptes Rendus. Physique, Vol. 15, Issue. 2-3, p. 140.

Printemps, Tony Mula, Guido Sette, Daniele Bleuet, Pierre Delaye, Vincent Bernier, Nicolas Grenier, Adeline Audoit, Guillaume Gambacorti, Narciso and Hervé, Lionel 2016. Self-adapting denoising, alignment and reconstruction in electron tomography in materials science. Ultramicroscopy, Vol. 160, Issue. , p. 23.

Hamngren Blomqvist, C. Gebäck, T. Altskär, A. Hermansson, A.-M. Gustafsson, S. Lorén, N. and Olsson, E. 2017. Interconnectivity imaged in three dimensions: Nano-particulate silica-hydrogel structure revealed using electron tomography. Micron, Vol. 100, Issue. , p. 91.

Gnanasekaran, Karthikeyan de With, Gijsbertus and Friedrich, Heiner 2018. Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials. Royal Society Open Science, Vol. 5, Issue. 5, p. 171838.

Oveisi, E. Spadaro, M.C. Rotunno, E. Grillo, V. and Hébert, C. 2019. Insights into image contrast from dislocations in ADF-STEM. Ultramicroscopy, Vol. 200, Issue. , p. 139.

Ribet, Stephanie M. Murthy, Akshay A. Roth, Eric W. dos Reis, Roberto and Dravid, Vinayak P. 2021. Making the most of your electrons: Challenges and opportunities in characterizing hybrid interfaces with STEM. Materials Today, Vol. 50, Issue. , p. 100.

Article contents

Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

Extract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests