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Volume 15 - Supplement S2 - July 2009

Contents

Page 8 of 39

Instrumentation and Techniques

Quantitative Atom-Probe Tomography

Abstract

  • Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)

  • C Klein, S Mutas, A Würfel, E Zschech
  • Published online by Cambridge University Press:
    26 July 2009, pp. 282-283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanoscale Microstructure in a Titanium Aluminide Alloy

  • S Gerstl, D Reinhard, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 284-285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance Improvements of Local Electrodes from In-situ Plasma Cleaning

  • R Ulfig, S Gerstl, TJ Prosa
  • Published online by Cambridge University Press:
    26 July 2009, pp. 286-287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A UK Facility for Atom Probe Tomography Analysis

  • EA Marquis, DW Saxey, A Cerezo, GDW Smith
  • Published online by Cambridge University Press:
    26 July 2009, pp. 288-289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study of Atomic Force Microscopy Probes Using a Local Electrode Atom Probe Microscope

  • C Tourek, S Sundararajan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 290-291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Wide-Field-of-View Atom Probe Reconstruction

  • BP Geiser, DJ Larson, E Oltman, S Gerstl, D Reinhard, TF Kelly, TJ Prosa
  • Published online by Cambridge University Press:
    26 July 2009, pp. 292-293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Improvements in Three-Dimensional Compositional Analysis of Complex Alloys

  • R Ulfig, E Oltman, DJ Larson, VS Smentkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 294-295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography

  • R Shivaraman, R Ulfig, DJ Larson, H Fukuzawa, DC Bell, H Wang, R Gordon
  • Published online by Cambridge University Press:
    26 July 2009, pp. 296-297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

  • TJ Prosa, D Lawrence, D Olson, DJ Larson, EA Marquis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 298-299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Field Evaporation of Octadecanethiol

  • TJ Prosa, S Kostrna Keeney, TF Kelly
  • Published online by Cambridge University Press:
    26 July 2009, pp. 300-301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A System for Simulation of Tip Evolution Under Field Evaporation

  • BP Geiser, DJ Larson, S Gerstl, D Reinhard, TF Kelly, TJ Prosa, D Olson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 302-303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atom-probe Tomography of Surface Oxides in a 20% Cold Worked Stainless Steel Tested Under PWR Primary Water Conditions

  • S Lozano-Perez, DW Saxey, EA Marquis, T Terachi, T Yamada
  • Published online by Cambridge University Press:
    26 July 2009, pp. 304-305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Analysis of Cementite in Steel by Atom Probe Tomography

  • J Takahashi, K Kawakami, Y Yamaguchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 306-307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Femtosecond Laser Atom Probe Analysis of Rare Earth Magnets

  • T Ohkubo, Y Chen, K Nogiwa, A Nishimura, K Hono
  • Published online by Cambridge University Press:
    26 July 2009, pp. 310-311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications

Abstract

  • The Hyperion™ Ion Probe for Next Generation FIB, SIMS and Nano-Ion, Implantation

  • N Smith, P Tesch, N Martin, R Boswell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 312-313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Dual Challenges for FIBXTEM in the Era of sub-50nm Feature Sizes

  • B Tracy, J Gray, E Adem, B Phillips, A delRosario, A Myers, M Sidorov, M Guillena
  • Published online by Cambridge University Press:
    26 July 2009, pp. 314-315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fabirication of Fine Electron Biprism Filament by Focused-Ion-Beam Chemical-Vapor-Deposition

  • S Matsui, K-I Nakamatsu, K Yamamoto, T Hirayama
  • Published online by Cambridge University Press:
    26 July 2009, pp. 316-317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Beam Induced Deposition and Etching: Fundamentals, Challenges and Nanotechnology–based Applications

  • J Fowlkes, DA Smith, MG Lassiter, PD Rack
  • Published online by Cambridge University Press:
    26 July 2009, pp. 318-319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges and Opportunities for Focused Ion Beam Processing at the Nano-scale

  • J Gierak, B Schiedt, D Lucot, A Madouri, E Bourhis, G Patriarche, C Ulysse, X Lafosse, L Auvray, L Bruchhaus, R Jede
  • Published online by Cambridge University Press:
    26 July 2009, pp. 320-321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 8 of 39