Instrumentation and Techniques
David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications
Abstract
Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 242-243
-
- Article
-
- You have access
- Export citation
Quantitative Atom-Probe Tomography
Abstract
Atom-probe Tomography, Small Angle Neutron Scattering, Transmission Electron Microscopy, Positron Annihilation Spectroscopy and X-ray Absorption Spectroscopy Characterization of Nano-scale Features in Nanostructured Ferritic Alloys
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 244-245
-
- Article
-
- You have access
- Export citation
Applications of Spatial Distribution Maps for Advanced Atom Probe Reconstruction and Data Analysis
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 246-247
-
- Article
-
- You have access
- Export citation
Evaluation of Local Radii of Atom-Probe-Tomography Specimens
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 248-249
-
- Article
-
- You have access
- Export citation
Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 250-251
-
- Article
-
- You have access
- Export citation
Cluster Detection and Quantification
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 252-253
-
- Article
-
- You have access
- Export citation
Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 254-255
-
- Article
-
- You have access
- Export citation
Background Removal Methods Applied to Atom Probe Data
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 256-257
-
- Article
-
- You have access
- Export citation
Sensitivity And Quantitativity In Atom Probe Tomography
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 258-259
-
- Article
-
- You have access
- Export citation
Promoting Standards in Quantitative Atom Probe Tomography Analysis
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 260-261
-
- Article
-
- You have access
- Export citation
Review of Atom Probe Tomography Applications for Semiconductor materials
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 262-263
-
- Article
-
- You have access
- Export citation
Data Mining and Informatics for Quantitative Atom Probe Tomography
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 264-265
-
- Article
-
- You have access
- Export citation
Partitioning Behavior of Al and Si in FINEMET Nanocrystalline Soft Magnetic Alloys, as Studied by Atom-Probe Tomography
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 266-267
-
- Article
-
- You have access
- Export citation
Investigations of Omega Precipitation in Titanium Molybdenum Alloys by Coupling 3D Atom Probe Tomography and High Resolution (S)TEM
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 268-269
-
- Article
-
- You have access
- Export citation
Grain Boundary Chemistry Before and After Ion Implantation in ODS Steels
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 270-271
-
- Article
-
- You have access
- Export citation
Investigation of Self-assembled Monolayer by Atom Probe Microscopy
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 272-273
-
- Article
-
- You have access
- Export citation
3-D Atom Probe Tomography of Resin Embedded Samples?
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 274-275
-
- Article
-
- You have access
- Export citation
Impurity Measurments in Polycrystallline Material with Atom Probe Tomography
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 276-277
-
- Article
-
- You have access
- Export citation
TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 278-279
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
-
- Article
-
- You have access
- Export citation