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< Back to all issues

Volume 15 - Supplement S2 - July 2009

Contents

Page 39 of 39

Tech Forum

Technologist Forum Special Topics Session: Electron Tomography

Abstract

  • Low Temperature Specimen Preparation for Electron Tomography

  • M Morphew, A Hoenger
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1530-1531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Plastic Section and Cryo-Electron Tomography Using the IMOD Software Package

  • D Nicastro
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1532-1533
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Tomography in Materials Science

  • DA Muller, PA Ercius
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1534-1535
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Tutorial

Image processing and interpretation in 3D electron microscopy

Abstract

  • Image Processing and Interpretation in Structural Electron Microscopy

  • B Heymann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1536-1537
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Back to the Basics: The Fundamentals of Cryo-electron Microscopy

Abstract

  • Back to the basics: The fundamentals of cryo-electron microscopy

  • T Dokland
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1538-1539
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Sample Preparation for Materials Scientists

Abstract

  • Sample Preparation for Materials Scientists

  • H Colijn
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1540-1541
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Back to the Basics: The Use of Transmission Electron Microscopy - What Are the Real Capabilities and When do I Use It?

Abstract

  • The Use of Transmission Electron Microscopy – What are the Real Capabilities and When can I use it?

  • J Ringnalda, G Scholes
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1542-1543
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Back to the Basics: FIB Sample Preparation of Thin Films and Soft Materials

Abstract

  • FIB Sample Preparation of Thin Films and Soft Materials

  • A Minor
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1544-1545
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • Nanostructure Characterization of Conical Silicon Carbide Nanowires and Heterostructures Induced by Release Catalysis

  • Z Liu, V Srot, NY Jin-Phillipp, PAV Aken, M Rühle, JC Yang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1546-1547
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 39 of 39