Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference

V-DH Hou

doi:10.1017/S1431927609093283

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Haruta, Mitsutaka Fujiyoshi, Yoshifumi Nemoto, Takashi Ishizuka, Akimitsu Ishizuka, Kazuo and Kurata, Hiroki 2020. Low Count Detection for EELS Spectrum by Reducing CCD Read-out Noise. Microscopy and Microanalysis, Vol. 26, Issue. S2, p. 1202.

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Ohtsuka, Masahiro Anan, Yoshihiro and Muto, Shunsuke 2024. Dopant site occupancies and iron valence states in SrZn Fe18−O27 W-type hexaferrites using site-selective X-ray/electron spectroscopy. Journal of Alloys and Compounds, Vol. 1005, Issue. , p. 176028.

Ali, Hasan Rusz, Jan Bürgler, Daniel E. Adam, Roman Schneider, Claus M. Tai, Cheuk-Wai and Thersleff, Thomas 2024. Noise-dependent bias in quantitative STEM-EMCD experiments revealed by bootstrapping. Ultramicroscopy, Vol. 257, Issue. , p. 113891.

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Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference

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