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Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic

Published online by Cambridge University Press:  26 July 2009

RE Edelmann
Affiliation:
Miami University
V Vasudevan
Affiliation:
University of Cincinnati
D Kohls
Affiliation:
University of Cincinnati
J Ullmer
Affiliation:
JoeXray LLC

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009