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Latest Developements in the New Wavelength Dispersive Solid-State Detector

Published online by Cambridge University Press:  26 July 2009

D Lesher ,
Y Diawara ,
S Medved ,
R Durst  and
V Sedov
D Lesher
Affiliation:
Advanced MicroBeam,Inc
Y Diawara
Affiliation:
Bruker AXS Microanalysis
S Medved
Affiliation:
Bruker AXS Microanalysis
R Durst
Affiliation:
Bruker AXS Microanalysis
V Sedov
Affiliation:
Bruker AXS Microanalysis

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 224 - 225
Copyright
Copyright © Microscopy Society of America 2009