Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Giannuzzi, Lucille A.
and
Utlaut, M.
2011.
A review of Ga+ FIB/SIMS.
Surface and Interface Analysis,
Vol. 43,
Issue. 1-2,
p.
475.
Zaluzec, Nestor J.
2014.
Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope.
Microscopy and Microanalysis,
Vol. 20,
Issue. 4,
p.
1318.
Kraxner, Johanna
Schäfer, Margit
Röschel, Otto
Kothleitner, Gerald
Haberfehlner, Georg
Paller, Manuel
and
Grogger, Werner
2017.
Quantitative EDXS: Influence of geometry on a four detector system.
Ultramicroscopy,
Vol. 172,
Issue. ,
p.
30.
Terborg, Ralf
Kaeppel, Andi
Yu, Baojun
Patzschke, Max
Salge, Tobias
and
Falke, Meiken
2017.
Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector.
Microscopy Today,
Vol. 25,
Issue. 2,
p.
30.
McBride, James R.
and
Rosenthal, Sandra J.
2019.
Real colloidal quantum dot structures revealed by high resolution analytical electron microscopy.
The Journal of Chemical Physics,
Vol. 151,
Issue. 16,