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Volume 15 - Supplement S2 - July 2009

Contents

Page 28 of 39

Instrumentation and Techniques

Transmission Electron Microscopy & Scanning Transmission Electron Microscopy

Abstract

  • New developments in phase Contrast Transmission Electron Microscopy with Electrostatic Phase Plate

  • D Alloyeau, WK Hsieh, E Anderson, G Benner, MJ Park, ED Gomez, NP Balsara, C Kisielowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1086-1087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

  • A Badami, M Beach, S Wood, S Rozeveld, J Marshall, W Heeschen, E Czerwinski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • REW program for the HRTEM image simulation, the alignment and the focus variation image reconstruction

  • F Lin, J Weng, J Chen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1090-1091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Near/Sub-50 pm TEM Resolution Images of Atoms Simulated with the Second Derivative of the Exit-Plane Wavefunction

  • HS Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fourier Analysis of Ronchigram and Aberration Assessment

  • K Ishizuka, K Kimoto, Y Bando
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1094-1095
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Observer Development for Automatic STEM Closed-Loop Control

  • A Tejada Ruiz, AJ den Dekker, SW van der Hoeven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1096-1097
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Using Holography to Evaluate CCD Camera Characteristics with High Accuracy

  • E Voelkl, D Tang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1100-1101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Users Perspective of Remote TEM

  • G Brown, A-J Bons, A van Balen, M Anthonis, J Stuyver, S de Rocker, M Levulis, E Estrada, S Wapp, J Butler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1102-1103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EFTEM, EELS, and Cathodoluminescence in Si-implanted SiO2 Layers

  • H-J Fitting, L Fitting Kourkoutis, R Salh, B Schmidt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1104-1105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Scanning Electron Microscopy & X-Ray Analysis

Abstract

  • SEM Contrast of Semi-insulating Compound Materials

  • H-J Fitting, JZ Kovacs
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1106-1107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Iterative Autofocus Algorithms for Scanning Electron Microscopy

  • M Rudnaya, RMM Mattheij, JML Maubach
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1108-1109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Porous Snow with SEM and Micro CT

  • RW Lomonaco, S Chen, I Baker
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1110-1111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM

  • SJ Bean, VM Kugler, D Connor
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1112-1113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microscopy of High Chloride Primary Froth: Non-mixing of emulsified water

  • GRD Elliott, VA Munoz, RJ Mikula
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1114-1115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Scanning Electron Microscopy and Analysis of Moist, Wet and Liquid Specimens

  • P Echlin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1116-1117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

  • V-D Hodoroaba, M Procop
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1118-1119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

  • M Procop, V-D Hodoroaba
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1120-1121
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM

  • V-D Hodoroaba, V Rackwitz, D Reuter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1122-1123
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 28 of 39