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Using Holography to Evaluate CCD Camera Characteristics with High Accuracy

Published online by Cambridge University Press:  26 July 2009

E Voelkl  and
D Tang
E Voelkl
Affiliation:
FEI Company
D Tang
Affiliation:
FEI Company,Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1100 - 1101
Copyright
Copyright © Microscopy Society of America 2009