A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

M Procop; V-D Hodoroaba

doi:10.1017/S143192760909432X

A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

Published online by Cambridge University Press: 26 July 2009

M Procop and

V-D Hodoroaba

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M Procop: Affiliation:
IfG – Institute for Scientific Instruments,Germany
V-D Hodoroaba: Affiliation:
Federal Institute for Materials Research & Testing,Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1120 - 1121

DOI: https://doi.org/10.1017/S143192760909432X [Opens in a new window]

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A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

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