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Volume 15 - Supplement S2 - July 2009

Contents

Page 29 of 39

Instrumentation and Techniques

Scanning Electron Microscopy & X-Ray Analysis

Abstract

  • Comparison of Experimental and Calculated Spatial Resolution in X-ray Microanalysis of Oxide and Silicate Minerals

  • KN Bozhilov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1124-1125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The use of Au and Pt x-ray N lines for correct EDX analysis of C in gold and platinum depositions of micro and nano structures

  • JJL Mulders, A Botman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1126-1127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Cation Stoichiometry from Microanalysis of Complex Perovskite Oxides

  • S Kolesnik, B Dabrowski, J Mais
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1128-1129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Surface Analysis techniques

Abstract

  • XPS Analysis of Fuel Cell Membrane Prepared Using an Ultra-Low-Angle-Microtomy Technique

  • HM Meyer, KS Reeves, KL More
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1130-1131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Scanned Probe Microscopy

Abstract

  • Scanning Surface Potential Microscopy of Spores on Planar Surfaces

  • I Lee, E Chung, H Kweon, S Yiacoumi, DC Joy, A Palumbo, C Tsouris
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1132-1133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Size Dependent Dynamics of Cantilever Beams Immersed in Viscous Fluid

  • W Fei, Z Xuezeng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1134-1135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Novel Operation Mode for Eliminating Influence of Inclination Angle and Friction in Atomic Force Microscopy

  • W Fei, W Yueyu, Z Faquan, Z Xuezeng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1136-1137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Optical Fluorescence Microscopy

Abstract

  • Single-Molecule Electron Transfer Reaction in Nanomaterials

  • D Hu, C Lei, EJ Ackerman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1138-1139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Analysis of Minerals Using Linearly Polarized Infrared Microspectroscopy

  • BA Weinger, PE Leary, JA Reffner
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1140-1141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three Dimensional Hyperspectral Imaging using Confocal Raman Microscopy

  • E Lee, J Shaver, S Kock, F Adar, A Whitley
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1142-1143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Education in Microscopy and Microanalysis

Abstract

  • Virtual SEM (VSEM) — Ongoing Development of Teaching Resources

  • NHM Caldwell, GC Martin, AL Mitchell, DM Holburn, BC Breton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1144-1145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Incorporating Electron Microscopy and Microanalysis into the Engineering Curricula

  • LA Dempere
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1146-1147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopy Resources and Education at the Institute of Materials Science, University of Connecticut

  • VC Solomon, RA Ristau, M Aindow
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1150-1151
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • Nanogenerators and Nanopiezotronics

  • ZL Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1152-1153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Synthesis and Characterization of Nano-pyramid Decorated ZnO Nanowires

  • D Tang, LF Allard, J Liu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1154-1155
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structures of Planar Defects in ZnO Nanobelts and Nanowires

  • Y Ding, Z Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1156-1157
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Synthesis and Property of Nanostructured ZnS

  • X Fang, Y Bando, D Golberg
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1158-1159
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-situ Catalytic Growth of Gallium Nitride Nanowires

  • R Diaz, R Sharma, S Mahajan, K Jarvis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1162-1163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-situ Observation of Graphene Sublimation and Edge Reconstructions

  • JY Huang, L Qi, J Li, F Ding, BI Yakobson, P Lu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1164-1165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 29 of 39