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Volume 15 - Supplement S2 - July 2009

Contents

Page 30 of 39

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • High Resolution Sculpting and Imaging for Graphene Nano-structures

  • DC Bell, W Wang, E Kaxiras
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1166-1167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution TEM and Electron Diffraction Study of Graphene Layers

  • Y Suh, S Park, M Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1168-1169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Passage of Single Hydrocarbon Chains Through a Defect of Carbon Nanotube

  • M Koshino, N Solin, Y Niimi, T Tanaka, H Isobe, E Nakamura
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1170-1171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Sol Gel Processing of Iron(III) Oxides Decorated Carbon Nanotubes

  • E Camponeschi, J Walker, H Garmestani, R Tannenbaum
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1172-1173
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Site Specific Deposition of Iron Particles for Carbon Nanotube Growth

  • SW Chee, C Yurga-Bell, R Sharma
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1174-1175
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of EuS Nanotubes in Quantum Confinement

  • A Thron, CS Bonifacio, N Erdman, M Harrison, S Somarajan, J Dickerson, K van Benthem
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1178-1179
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Functionalization of a Single TiO2 Nanotube for Bio Sensor Applications

  • D Cha, M Lee, H Shin, MJ Kim, J Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1180-1181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

  • Z Zhang, X Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1182-1183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Probing the Mechanical Properties of Nanostructures in the TEM

  • A Minor, J Ye, C Chisholm, R Mishra, Z Shan, O Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1184-1185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM

  • N Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1186-1187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative TEM Tensile Testing on 1D Nano-structural Materials

  • ZW Shan, J Oh, A Minor, SAS Asif, OL Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Study of Pt Cluster Incorporated Zeolite A

  • Y Shi, F Wang, J Qian, H Yang, L Ding, P Li, S Ng, J Chen, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1190-1191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Direct Observation of TiO2 (110) Surfaces by HVEM and HAADF STEM

  • N Shibata, A Goto, T Mizoguchi, S Findlay, SY Choi, T Yamamoto, I Yuichi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1194-1195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Description of the Interface Between γ and γ′ Particles in a Ni-Al Alloy by HREM.

  • H Calderon, L Calzado-Lopez, T Mori
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1196-1197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration-Corrected STEM Imaging and 2-D Elemental-Resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

  • HL Xin, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1198-1199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In Situ and High Resolution TEM Studies of Nano-scale Materials

  • R Sinclair, AL Koh, P Kempen, HJ Jung
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1200-1201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Anisotropic FCC Metal Nanostructures by Kinetically Controlled Synthesis

  • J Wang, Y Xiong, B Lim, Y Xia, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1202-1203
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 30 of 39