Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

V-D Hodoroaba; M Procop

doi:10.1017/S1431927609094112

Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

Published online by Cambridge University Press: 26 July 2009

V-D Hodoroaba and

M Procop

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V-D Hodoroaba: Affiliation:
Federal Institute for Materials Research & Testing,Germany
M Procop: Affiliation:
IfG – Institute for Scientific Instruments,Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1118 - 1119

DOI: https://doi.org/10.1017/S1431927609094112 [Opens in a new window]

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Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

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