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Volume 15 - Supplement S2 - July 2009

Contents

Page 26 of 39

Physical Sciences

Ferroelectrics, Ceramics and Oxides

Abstract

  • Stoichiometry of Nanocrystalline VOx Thin Films Determined by Electron Energy Loss Spectroscopy

  • J Li, BD Gauntt, J Kulik, EC Dickey
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1004-1005
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reversible Phase Transformation in Y2O3 Under High Pressure

  • JF Al-Sharab, BH Kear, OA Voronov, RK Sadangi, SL Deutsch, NB Kavukcuoglu, AB Mann, SD Tse
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1006-1007
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Characterization of Ba0.6Sr0.4TiO3 – MgO Composite Thin Films

  • O Ugurlu, DM Feldmann, QX Jia, TG Holesinger
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1008-1009
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Spherical Aberration Corrected TEM/STEM Analysis of La2O3 Thin Film Deposited on Si (001) Substrate

  • S Inamoto, J Yamasaki, E Okunishi, K Kakushima, H Iwai, N Tanaka
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1010-1011
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Scale Compositions Across DyScO3/SrTiO3 Interfaces

  • M Luysberg, M Heidelmann, L Houben, M Boese, T Heeg, M Röckerath, J Schubert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1012-1013
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Diffuse Scattering Study of Perovskite Thin Films

  • J Pacaud, F Pailloux
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1016-1017
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Burgers Vector Determination of Threading Screw Dislocations in 4H-SiC via Forescattered Electron Channeling Contrast Imaging

  • ME Twigg, YN Picard, JD Caldwell, CR Eddy
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1018-1019
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Stress Modulated Composition Fluctuation and Diffusion in near lattice match AlInN/GaN

  • A Mouti, J-L Rouvière, Nicolas Grandjean, Pierre Stadelmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1020-1021
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • SrTiO3 (001) ( × )R33.7° Surface Reconstruction

  • D Kienzle, B Quezada, LD Marks
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1022-1023
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Soft Electron Beam Lithography (Soft-eBL) Patterning of 0- and 1-D Nanostructures of Magnetic and Ferroelectric Oxides

  • B Liu, VP Dravid
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1024-1025
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Growth and Structural Characterization of Multiferroic Thin Films and Nanopatterns

  • S Xie, Z Pan, J Cheng, G Sterbinsky, B Wessels, VP Dravid
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1026-1027
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Interfacial Structure in Multiferroic BiFeO3 Thin Films

  • HJ Chang, AY Borisevich, N Balke, SV Kalinin, R Ramesh, M Huijben, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1028-1029
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Domain Structure Control of BiFeO3 Films Through Substrate Symmetry and Film Thickness

  • CT Nelson, Y Zhang, CM Folkman, CB Eom, JF Mansfield, XQ Pan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1030-1031
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Jet Soot: Chemical and Structural Characterization via XPS and HRTEM

  • V Bryg, R Vander Wal
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1032-1033
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • SEM Investigations of TiB2 and TiBN Coatings Produced by DC Magnetron Sputtering

  • R Wuhrer, W Yeung, T Lucey, J Giddings, G McCredie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1034-1035
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Monodispersed Spindle-like Particles of Titania

  • N Murafa, V Stengl, V Houšková
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1036-1037
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Warfare Agents Degradation on Zirconium Doped Titania

  • V Stengl, S Bakardjieva, N Murafa, F Opluštil, L Österlund, A Mattsson, PO Andersson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1038-1039
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low Loss EELS Study of the Ultrathin SrTiO3 Film Grown on the Si Single Crystal

  • D Su, M Couillard, M Sawicki, C Broadbridge, Y Zhu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1040-1041
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Synthesis and Characterization of CeO2 Nanoparticles

  • RK Hailstone, AG DiFrancesco, KJ Reed
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1042-1043
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 26 of 39