Symposium D – Defect & Impurity Engineered Semiconductors & Devices II
Research Article
Injection-Level Spectroscopy of Metal Impurities in Silicon
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- 10 February 2011, 575
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Point Defect Characterization of Zn- and Cd-Based Semiconductors Using Positron Annihilation Techniques
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- 10 February 2011, 583
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Metal Impurity Mapping in Semiconductor Materials Using X-Ray Fluorescence
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- 10 February 2011, 589
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Characterization of Deep Impurities in Semiconductors by Terahertz Tunnel Ionization
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- 10 February 2011, 595
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Picosecond time-resolved studies of defect-related recombination in high resistivity CdTe, CdZnTe
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- 10 February 2011, 601
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Measurement of the Temperature Dependence of Silicon Recombination Lifetimes
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- 10 February 2011, 607
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Characterization of the Structure and Polarity of Twin Boundaries in GaP
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- 10 February 2011, 613
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A Novel Detection System for Defects and Chemical Contamination in Semiconductors Based Upon the Scanning Kelvin Probe
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- 10 February 2011, 619
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An Investigation of the Limit of Detection and the Scattering Dependence of the Optical Precipitate Profiler (OPP)
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- 10 February 2011, 627
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Recombination Strength at Intra and Intergrain Defects in Crystalline Silicon Investigated by Low Temperature Lbic Scan Maps
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- 10 February 2011, 633
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Impurity Segregation in Al Doped GaSb Studied by Cathodoluminescence Microscopy
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- 10 February 2011, 639
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Phosphorus Passivation of GaAs
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- 10 February 2011, 647
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Controlled Surface Fermi-level on the SeS2-passivated n-GaAs (100)
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- 10 February 2011, 653
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The Impact of Rapid Thermal Annealing on the Properties of the Si (100)-SiO2 Interface
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- 10 February 2011, 659
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A Molecular Dynamics Study of Step Motions on Vicinal Silicon Surfaces
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- 10 February 2011, 665
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