Symposium G – Atomic Resolution Microscopy of Surfaces and Interfaces
Research Article
Hrtem Studies of Dislocations and Interfaces in TiAl
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- 10 February 2011, 131
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Atomic Structure of 66° [110] Asymmetric Tilt Grain Boundary in Aluminum
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- 10 February 2011, 139
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Stress Induced Structural Changes of Interphase Boundaries and Mechanical Twins in two-Phase γ-Titanium Aluminides
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- 10 February 2011, 145
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Atomic-Resolution Electron Microscopy of TiB2 Precipitates in an Industrial TiAl Alloy
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- 10 February 2011, 151
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Evolution of Morphology During Etching of Si
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- 10 February 2011, 157
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STM Study of
Reconstruction on Si(III)
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- 10 February 2011, 167
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Photoexcited Carrier Effect on Imaging of Organic Molecules On Si(100)2×l Surfaces
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- 10 February 2011, 173
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Fracture Surface Topography of Energetic Materials using Atomic Force Microscopy
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- 10 February 2011, 179
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In-Situ High Resolution Transmission Electron Microscopy of Solid-Liquid Interface of Alumina
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- 10 February 2011, 185
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Time-Dependent Interfacial Reaction Mechanism in a Spinel-Forming Solid State Reaction Studied by TEM
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- 10 February 2011, 191
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Electron Microscopy Studies of the High Temperature Oxidation Behavior of NiAl
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- 10 February 2011, 197
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STM Study of a Defect-Related Si(001)-c(4×4) Surface
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- 10 February 2011, 203
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Equilibrium Configuration of Bi-Doped ZnO Grain Boundaries: Intergranular Amorphous Films
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- 10 February 2011, 209
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Atomic Structure of Interfaces in Mazed Au Bicrystals
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- 10 February 2011, 215
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A Novel Stem-Based Mass Spectroscopic Technique: Applications to Catalytic Materials
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- 10 February 2011, 227
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Atomic Force Microscopy Study of Stabilized Quasi-Amorphous Carbon in the Range of Thickness from 5 nm To 300 μm
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- 10 February 2011, 233
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Kinetic Investigations of the Initial Oxidation Stage of Copper by In-Situ UHV-TEM
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- 10 February 2011, 239
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Quantitative Analysis of Displacement at 90° Domain Boundaries In BaTiO3 and PbTiO3
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- 10 February 2011, 245
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Quantitative Eels Profiling of Planar Faults in CaTiO3 Perovskite Approaching Atomic Resolution: A Comparison With Z-Contrast Imaging
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- 10 February 2011, 253
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Imaging the Dimers in Si (111) 7×7
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- 10 February 2011, 259
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