Symposium D – Materials, Technology & Reliability for Advanced Interconnects..
Research Article
Microstructural Analysis of Copper Interconnections Using Picosecond Ultrasonics
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- 17 March 2011, D7.5.1
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The Effects of the Mechanical Properties of the Confinement Material on Electromigration in Metallic Interconnects
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- 17 March 2011, D10.2.1
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Organic Solution Deposition of Copper Seed Layers onto Barrier Metals
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- 17 March 2011, D9.19.1
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The Integration of Low-k Dielectric Material Hydrogen Silsesquioxane (HSQ) with Nitride Thin Films as Barriers
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- 17 March 2011, D9.11.1
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Volatile Liquid Precursors for the Chemical Vapor Deposition (CVD) of Thin Films Containing Tungsten
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- 17 March 2011, D9.12.1
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Electromigration Characterization Versus Texture Analysis in Damascene Copper Interconnects
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- 17 March 2011, D2.4.1
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Curing Study of Hydrogen Silsesquioxane Under H2/N2 Ambient
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- 17 March 2011, D5.12.1
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Ultra Low-K Inorganic Silsesquioxane Films with Tunable Electrical and Mechanical Properties
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- 17 March 2011, D5.18.1
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Integrated CVD-PVD Al Plug Process for Sub-Quarter Micron Devices: Effects of Underlayer on the Via Filling and the Microstructure of the Al Film
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- 17 March 2011, D8.1.1
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Stressmigration Behavior of Multilevel Ulsi Alcu-Metallizations
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- 17 March 2011, D2.6.1
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Study of Ta as a Diffusion Barrier in Cu/SiO2 Structure
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- 17 March 2011, D9.18.1
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Backside Copper Contamination Issues in CMOS Process Integration – A Case Study
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- 17 March 2011, D8.4.1
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Grazing Incidence Small Angle X-Ray Scattering Study on Low Dielectric Thin Films
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- 17 March 2011, D5.23.1
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Room Temperature Recrystallization of Electroplated Copper Thin Films: Methods and Mechanisms
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- 17 March 2011, D10.1.1
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Experimental Studies of the Reliability of Interconnect Trees
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- 17 March 2011, D8.7.1
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Microstructure and Electronic Properties of Thin Film Nanoporous Silica as a Function of Processing and Annealing Methods
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- 17 March 2011, D5.16.1
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Via Electromigration Lifetime Improvement of Aluminum Dual-Damascene Interconnects by Using Soft Low-k Organic SOG Interlayer Dielectrics
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- 17 March 2011, D2.5.1
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Low Dielectric Constant Porous Silsesquioxane Films: Effect of Thermal Treatment
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- 17 March 2011, D5.15.1
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Fabrication of Air-Gaps Between Cu Interconnects for Low Intralevel k.
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- 17 March 2011, D4.8.1
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Electromigration Reliability of Dual-Damascene Cu/Oxide Interconnects
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- 17 March 2011, D2.3.1
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