Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Expanding the Limits of Atom Probe Tomography

3D-Atomic-Scale Analysis of Magnetoelectric Multiferroic Topologies via Scanning Transmission Electron Microscopy and Spectroscopy Complemented by Atom Probe Tomography

Nanoscale Spatial and Chemical Exploration of Porcine Trabeculae Bone using Atom Probe Tomography

Atom Probe Tomography of Catalyst Nanoparticles

Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface

The Effect of ω- and α-Phase Precipitation on the β-Phase Lattice Parameters During 400°C aging in Ti-11Cr(at.%)

On Demand - Expanding the Limits of Atom Probe Tomography

Are vacancies in field ion microscopy artefacts? A DFT study

Expanding the Limits of Atom Probe Crystallographic Analysis

Quantifying Lithium in Lithium-ion battery solid electrolyte by atom probe tomography correlated with high-resolution scanning electron microscopy

Science of Metrology with Electrons

Imaging the Electronic Structure of Strained Epitaxial Monolayer Graphene

Imaging Atomically Thin Transition Metal Dichalcogenides Using Deep Ultraviolet Photoelectron Emission Microscopy

Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements

The Reproducibility Crisis, a Comprehensive Set of Guides on XPS, and Better Data Fitting/Chemometrics of XPS Data

A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides

Development of Observation Method for Spatial Electromagnetic Fields by Using Conventional Scanning Electron/Ion Microscope

Simple Method to Determine the Rotation Between a TEM Image and Diffraction Pattern

Detectability & Sensitivity vs Incident Beam Energy in Modern Analytical Electron Microscopes

Effect of Sampling on Geometric Phase Analysis Sensitivity for Strain Measurement in Scanning Transmission Electron Microscopy

Integrated Nanophotonic Electron Beam Modulators Enable Ultra-High Precise Method for Calibrating EELS Spectrometers

A Low-Noise, Two-Channel STEM EBIC Metrology System

High-Speed, High-Precision, and High-Throughput Strain Mapping with Cepstral Transformed 4D-STEM Data

Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Expanding the Limits of Atom Probe Tomography

On Demand - Expanding the Limits of Atom Probe Tomography

Science of Metrology with Electrons