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Imaging the Electronic Structure of Strained Epitaxial Monolayer Graphene

Published online by Cambridge University Press:  22 July 2022

Falk Niefind
Affiliation:
Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, United States
Henry G. Bell
Affiliation:
Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States Department of Physics, Macalester College, Saint Paul, MN, United States
Thuc Mai
Affiliation:
Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Angela R. Hight Walker
Affiliation:
Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Randolph E. Elmquist
Affiliation:
Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Sujitra Pookpanratana*
Affiliation:
Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Science of Metrology with Electrons
Copyright
Copyright © Microscopy Society of America 2022

References

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Milovanovic, S. et al. , Physical Review B 102 (2020), p. 245427 doi: 10.1103/PhysRevB.102.245427.CrossRefGoogle Scholar