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Are vacancies in field ion microscopy artefacts? A DFT study

Published online by Cambridge University Press:  22 July 2022

Shyam Katnagallu*
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Christoph Freysoldt
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Joerg Neugebauer
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
On Demand - Expanding the Limits of Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2022

References

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