Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T13:27:35.665Z Has data issue: false hasContentIssue false
  • English
  • Français

Detectability & Sensitivity vs Incident Beam Energy in Modern Analytical Electron Microscopes

Published online by Cambridge University Press:  22 July 2022

Nestor J. Zaluzec
Nestor J. Zaluzec*
Affiliation:
Photon Sciences Directorate, Argonne National Laboratory, Lemont, Il, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 784 - 786
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

See the WWW sites of leading manufacturers of analytical electron microscopes and x-ray systems.Google Scholar
Gatti, E., Rehak, P, “Semiconductor Drift Chamber – An Application of a Novel Charge Transport Scheme”, Nucl. Instr. & Meth. In Phys. Res. 225 (1984), p. 608.Google Scholar
Chen, W. et al. , IEEE Trans. on Nucl. Sci. 39 (1992), p. 619.CrossRefGoogle Scholar
Iwanczyk, J.S. et al. , Nucl. Instr. & Meth. in Phys. Res. A380 (1996), p. 288.CrossRefGoogle Scholar
Iwanczyk, J.S. et al. , Micro. Microanal. 7, S2 (2001), p. 1052.CrossRefGoogle Scholar
Barkan, S. et al. , Microscopy Today 12 (6) (2004), p. 36.Google Scholar
Watanabe, M., Wade, C.A., Microsc Microanal 19(Suppl 2) (2004), p. 1264.CrossRefGoogle Scholar
Tordoff, B. et al. , Proceedings of EMC-2012, Manchester, September, (2012), PS2.2.Google Scholar
von Harrach, H.S. et al. , Microsc Microanal 15 (S2), p. 208.CrossRefGoogle Scholar
Zaluzec, N.J., Micro. Microanal., 10 S2 (2004), p. 122.CrossRefGoogle Scholar
Zaluzec, N.J., Microscopy Today 17(4) (2009), p. 56.CrossRefGoogle Scholar
Zaluzec, N.J., Microsc. Microanal. 27 (Suppl 1), (2021), p. 2070; doi:10.1017/S1431927621007492CrossRefGoogle Scholar
Zaluzec, N.J., Microscopy and Microanalysis (2021), p. 1. doi:10.1017/S143192762101360XGoogle Scholar
Zaluzec, N.J., Microsc. Microanal. 22 (2016), p. 230. DOI:10.1017/S1431927615015755CrossRefGoogle Scholar
Fiori, C.E. Swyt, CR, Willis, JR, “The Theoretical to Characteristic Continuum Ratio in Energy Dispersive Analysis in the Analytical Electron Microscope.” Microbeam Analysis-1982, SF Press 57-71 (1982)Google Scholar
Zaluzec, N.J., Ultramicroscopy 203 (2019), p. 163.CrossRefGoogle Scholar
Acknowledgements; This work was supported by the Photon Science Directorate and Laboratory Directed Research and Development (LDRD) funding from Argonne National Laboratory, provided by the Director, as well as the Office of Science, of the U.S. Department of Energy under Contract No. DE-AC02-06CH11357.Google Scholar