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High-Speed, High-Precision, and High-Throughput Strain Mapping with Cepstral Transformed 4D-STEM Data

Published online by Cambridge University Press:  22 July 2022

Dasol Yoon ,
Harikrishnan K.P. ,
Yu-Tsun Shao  and
David A. Muller
Dasol Yoon
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States
Harikrishnan K.P.
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 796 - 798
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Copyright
Copyright © Microscopy Society of America 2022

References

Peng, Z et al. , Light Sci Appl 9 (2020), p. 190. doi: 10.1038/s41377-020-00421-5CrossRefGoogle Scholar
Schlom, D et al. , MRS Bulletin 39 (2014), p. 118. doi: 10.1557/mrs.2014.1CrossRefGoogle Scholar
Padgett, E et al. , Ultramicroscopy 214 (2020), p. 112994. doi: 10.1016/j.ultramic.2020.112994CrossRefGoogle Scholar
Philipp, HT et al. , arXiv:2111.05889 [physics.ins-det] (2021)Google Scholar
Work primarily supported by the Center for Alkaline Based Energy Solutions (CABES), a DOE EFRC BES award # DE-SC0019445. Facilities supported by the National Science Foundation (DMR-1429155, DMR- 2039380, DMR-1719875)Google Scholar