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The Reproducibility Crisis, a Comprehensive Set of Guides on XPS, and Better Data Fitting/Chemometrics of XPS Data

Published online by Cambridge University Press:  22 July 2022

Tahereh G. Avval ,
George H. Major  and
Matthew R. Linford
Tahereh G. Avval
Affiliation:
Brigham Young University, Department of Chemistry and Biochemistry, Provo, UT, USA
George H. Major
Affiliation:
Brigham Young University, Department of Chemistry and Biochemistry, Provo, UT, USA
Matthew R. Linford
Affiliation:
Brigham Young University, Department of Chemistry and Biochemistry, Provo, UT, USA

Abstract

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Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 772 - 773
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Copyright
Copyright © Microscopy Society of America 2022

References

Major, GH et al. , Journal of Vacuum Science & Technology A. 2020; 38:061204.CrossRefGoogle Scholar
Linford, MR et al. , Microscopy and Microanalysis. 2020; 26:1–2.CrossRefGoogle Scholar
Gengenbach, TR et al. , Journal of Vacuum Science & Technology A. 2021; 39:013204.CrossRefGoogle Scholar
Baer, DR et al. , Journal of Vacuum Science & Technology A. 2019; 37:031401.CrossRefGoogle Scholar
Major, GH et al. , Journal of Vacuum Science & Technology A. 2020; 38:061203.CrossRefGoogle Scholar