Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Ga+ FIB Milling and Measurement of FIB Damage in Sapphire

Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling

A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam

Efficient Diffractive Phase Optics for Electrons

Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries

Gas-Mediated Electron Beam Induced Etching - From Fundamental Physics to Device Fabrication

An Improved Specimen Preparation of Porous Powder Materials for Transmission Electron Microscopy

Super Resolution Microscopic Methods

Abstract

Coherent Diffraction Imaging

Modeling Extensions of Fourier Ptychographic Microscopy

Super-resolved Ptychographic Imaging

Generalised Holography Meets Coherent Diffractive Imaging

Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Maximum Efficiency STEM Phase Contrast Imaging

Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Super Resolution Microscopic Methods

Abstract